Neutron Diffraction Texture Analysis of Multiphase and Low-Symmetry Materials Using the Position-Sensitive Detector Julios and Peak Deconvolution Methods

Abstract

Diffraction patterns of multiphase and low-symmetry materials are characterized by a manifold of reflections with high peak overlap, hindering individual pole figure measurements by conventional X-ray technique. These difficulties can be overcome by using neutron diffraction with its advanced position-sensitive detector technology and by separating overlapping peaks by means of profile fitting methods. The paper describes appropriate instrumental equipment and a semi-automatic procedure for individual pole figure data analysis to be performed interactively on a PC. Pole figure results of a two-phase chalcopyrite ore are given.