Ninth International Conference on Textures of MaterialsView this Special Issue
W. Schäfer, P. Merz, E. Jansen, G. Will, "Neutron Diffraction Texture Analysis of Multiphase and Low-Symmetry Materials Using the Position-Sensitive Detector Julios and Peak Deconvolution Methods", Texture, Stress, and Microstructure, vol. 14, Article ID 162813, 7 pages, 1991. https://doi.org/10.1155/TSM.14-18.65
Neutron Diffraction Texture Analysis of Multiphase and Low-Symmetry Materials Using the Position-Sensitive Detector Julios and Peak Deconvolution Methods
Diffraction patterns of multiphase and low-symmetry materials are characterized by a manifold of reflections with high peak overlap, hindering individual pole figure measurements by conventional X-ray technique. These difficulties can be overcome by using neutron diffraction with its advanced position-sensitive detector technology and by separating overlapping peaks by means of profile fitting methods. The paper describes appropriate instrumental equipment and a semi-automatic procedure for individual pole figure data analysis to be performed interactively on a PC. Pole figure results of a two-phase chalcopyrite ore are given.
Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.