Texture, Stress, and Microstructure

Texture, Stress, and Microstructure / 1991 / Article
Special Issue

Ninth International Conference on Textures of Materials

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Volume 14 |Article ID 342713 | https://doi.org/10.1155/TSM.14-18.355

A. D. Rollett, H.-R. Wenk, F. Heidelbach, T. G. Schofield, R. E. Muenschausen, I. D. Raistrick, P. N. Arendt, D. A. Korzekwa, K. Bennett, J. S. Kallend, "Texture-Property Relationships in the High Temperature Superconductors", Texture, Stress, and Microstructure, vol. 14, Article ID 342713, 8 pages, 1991. https://doi.org/10.1155/TSM.14-18.355

Texture-Property Relationships in the High Temperature Superconductors

Abstract

Textures have been measured by means of X-ray pole figures for high temperature superconductor materials in both bulk and thin film form. Variations in the epitaxy of the yttrium-based thin films are correlated with processing history and properties. Textures are given for deformation-processed Bi-based material, which, when subsequently melt-proCessed, exhibits high critical currents. The surface resistance of Tl-based films on a silver substrate are correlated with the sharpness of the texture.

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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