Ninth International Conference on Textures of MaterialsView this Special Issue
A. D. Rollett, H.-R. Wenk, F. Heidelbach, T. G. Schofield, R. E. Muenschausen, I. D. Raistrick, P. N. Arendt, D. A. Korzekwa, K. Bennett, J. S. Kallend, "Texture-Property Relationships in the High Temperature Superconductors", Texture, Stress, and Microstructure, vol. 14, Article ID 342713, 8 pages, 1991. https://doi.org/10.1155/TSM.14-18.355
Texture-Property Relationships in the High Temperature Superconductors
Textures have been measured by means of X-ray pole figures for high temperature superconductor materials in both bulk and thin film form. Variations in the epitaxy of the yttrium-based thin films are correlated with processing history and properties. Textures are given for deformation-processed Bi-based material, which, when subsequently melt-proCessed, exhibits high critical currents. The surface resistance of Tl-based films on a silver substrate are correlated with the sharpness of the texture.
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