Table of Contents
Textures and Microstructures
Volume 14–18
http://dx.doi.org/10.1155/TSM.14-18.355

Texture-Property Relationships in the High Temperature Superconductors

1Los Alamos National Laboratory, NM 87545, USA
2Univ. of California, Berkeley, CA 94720, USA
3Illinois Institute of Technology, Chicago, IL 60616, USA

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Textures have been measured by means of X-ray pole figures for high temperature superconductor materials in both bulk and thin film form. Variations in the epitaxy of the yttrium-based thin films are correlated with processing history and properties. Textures are given for deformation-processed Bi-based material, which, when subsequently melt-proCessed, exhibits high critical currents. The surface resistance of Tl-based films on a silver substrate are correlated with the sharpness of the texture.