Table of Contents
Textures and Microstructures
Volume 14 (1991)–18
http://dx.doi.org/10.1155/TSM.14-18.273

Automated Lattice Orientation Determination From Electron Backscatter Kikuchi Diffraction Patterns

Department of Mechanical Engineering, Yale University, USA

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The ability to measure individual orientations from crystallites enables a more complete characterization of the microstructure. A primary obstacle to the use of single orientation measurements is the large investment of direct operator time necessary to obtain a statistically reliable data set. The most viable technique for obtaining individual orientation measurements is electron backscatter Kikuchi diffraction (BKD). Current technology requires an operator to identify a zone axis pair in a BKD pattern. This paper describes research in progress to automate the identification of lattice orientation from BKD patterns by identifying the planes associated with the bands that appear in the patterns. This work considered FCC crystal symmetry.