Texture, Stress, and Microstructure

Texture, Stress, and Microstructure / 1991 / Article
Special Issue

Ninth International Conference on Textures of Materials

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Volume 14 |Article ID 564029 | https://doi.org/10.1155/TSM.14-18.73

L. de Buyser, P. van Houtte, E. Aernoudt, "X-Ray Measurement of Residual Stresses in Textured Thin Coatings", Texture, Stress, and Microstructure, vol. 14, Article ID 564029, 6 pages, 1991. https://doi.org/10.1155/TSM.14-18.73

X-Ray Measurement of Residual Stresses in Textured Thin Coatings

Abstract

The X-ray diffraction technique is a well known non-destructive method to determine the residual stress level in a material. The most commonly used method is the 'd-sin2Ψ' method. However for textured materials and very thin coatings (0.1 .. 2 μm), this method can no longer be applied as will be shown. Therefore, a new measurement method, based on the ’glance angle’ technique has been developed.

Copyright © 1991 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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