Table of Contents
Textures and Microstructures
Volume 19 (1992), Issue 4, Pages 189-196
http://dx.doi.org/10.1155/TSM.19.189

X-Ray Diffraction Method for Determination of Texture Evolution in Layers

Institute of Physical Chemistry, Bulgarian Academy of Sciences, Sofia 1040, Bulgaria

Received 1 October 1991

Copyright © 1992 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

I. Tomov, R. Banova, and S. Surnev, “X-Ray Diffraction Method for Determination of Texture Evolution in Layers,” Textures and Microstructures, vol. 19, no. 4, pp. 189-196, 1992. doi:10.1155/TSM.19.189