Abstract
The yield strength anisotropy of aluminum-lithium sheet is known to be strongly dependent on crystallographic texture and grain morphology. In this study, the microstructure and texture of unrecrystallized and recrystallized variants of 2090 were examined in an SEM, using a combination of backscattered electron imaging and Kikuchi patterns. Local orientation measurements both through the sheet thickness and parallel to the rolling direction were used to determine the degree of misorientation between nearest-neighbor grains. Yield strength predictions based on the spatially resolved texture measurements show that the course, recrystallized grains have reduced in-plane and through-thickness anisotropy compared to the unrecrystallized structure.