Abstract
Measurements of the crystallographic orientation of individual grains provide information on the spatial arrangement and distribution of orientations in a crystalline solid, i.e. on the orientation topography, which can be utilized to establish a basis for a deeper understanding of the microstructural mechanisms during deformation and recrystallization of metallic materials.Techniques for the convenient measurement of single grain orientations with high accuracy by evaluation of Kikuchi diagrams in a TEM and SEM (EBSD) are introduced. The principles of Kikuchi pattern formation as well as the measuring and evaluation procedures are outlined. Particular attention is focused on the automation of pattern indexing in order to provide fully automated evaluation routines. The unique potential of these techniques is demonstrated by two examples pertaining to the microstructural evolution during the formation of recrystallization nuclei and their subsequent growth.