Table of Contents
Textures and Microstructures
Volume 26 (1996)–27
http://dx.doi.org/10.1155/TSM.26-27.111

Analysis of Crystallographic Texture in Small Sample Areas

1Technische Universität Dresden, Institut für Kristallographie und Festkörperphysik, Dresden D-01062, Germany
2Universität Augsburg, Institut für Physik, Augsburg D-86135, Germany
3Technische Universität Clausthal, Institut für Metallkunde und Metallphysik, Clausthal-Zellerfeld D-38678, Germany

Received 20 February 1996

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The description of texture by means of a small number of components (preferred orientations) is an exceptionally concise method. It may reveal relevant information about the texture modifying process even in those cases where the texture information, contained in the experimental pole figures, is rather limited. Some examples for texture estimates and interpretation of local textures in thin layers (SiC films synthesized by carbonization of silicon with fullerenes) and bulk materials (shear bands in brass and titanium) are presented.