Abstract
The description of texture by means of a small number of components (preferred orientations) is an exceptionally concise method. It may reveal relevant information about the texture modifying process even in those cases where the texture information, contained in the experimental pole figures, is rather limited. Some examples for texture estimates and interpretation of local textures in thin layers (SiC films synthesized by carbonization of silicon with fullerenes) and bulk materials (shear bands in brass and titanium) are presented.