Table of Contents
Textures and Microstructures
Volume 26 (1996)–27

On the Crystallographic Basis of Yield Criteria

Department of Materials Science and Engineering, The University of Michigan, 2034 Dow Building, 2300 Hayward St., Ann Arbor, Ml 48109-2136, USA

Received 10 November 1995; Accepted 10 January 1996

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

William F. Hosford, “On the Crystallographic Basis of Yield Criteria,” Textures and Microstructures, vol. 26, pp. 479-493, 1996. doi:10.1155/TSM.26-27.479