Abstract
The reliability of the harmonic method of the ODF calculation from X-ray pole figures was estimated for cubic symmetry materials. For this purpose simulated textures with a preset scattering value of the components were used. Some examples using the Roe method to the study of the secondary recrystallization process in the Fe-3% Si alloy are given. The capabilities of the etch-pits methods as the simplest discrete method used to determine the orientation density are discussed.