Table of Contents
Textures and Microstructures
Volume 29, Issue 1-2, Pages 53-64
http://dx.doi.org/10.1155/TSM.29.53

X-Ray Stress Analysis by Use of an Area Detector

Fraunhofer-Einrichtung für Zuverlässigkeit und Mikrointegration (IZM), Gustav-Meyer-Allee 25, Berlin D-13355, Germany

Received 14 February 1995

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

A. Schubert, B. Kämpfe, and S. Goldenbogen, “X-Ray Stress Analysis by Use of an Area Detector,” Textures and Microstructures, vol. 29, no. 1-2, pp. 53-64, 1997. https://doi.org/10.1155/TSM.29.53.