Table of Contents
Textures and Microstructures
Volume 29, Issue 1-2, Pages 89-101
http://dx.doi.org/10.1155/TSM.29.89

Use of Imaging Plates in X-Ray Analysis

STOE & CIE GmbH, Application Laboratory, Hilpertstraße 10, Darmstadt D-64295, Germany

Received 18 September 1995

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Two-dimensional detectors have opened a new area for the investigation of both single crystals and polycrystalline materials. The working principle of Imaging Plates is described. Some characteristics and the advantages of an Imaging Plate are discussed using the STOE Imaging Plate Diffraction System for different kinds of X-ray analysis: (i) single crystal diffractometry, (ii) powder diffraction and (iii) stress and texture investigations.