Table of Contents
Textures and Microstructures
Volume 29 (1997), Issue 1-2, Pages 77-87

Silicon in Fe-Si Alloys: Correction of X-Ray Intensities for Preferred Orientation

1Crystallography and Mineralogy Center, IICT, Al. Afonso Henriques, 41–4°E, Lisboa 1000, Portugal
2Center for Mineral Resources, CVRM/IST, Lisboa Codex 1096, Portugal
3Dept. Materials Eng., IST/UTL, Av. Rovisco Pais, Lisboa Codex 1096, Portugal

Received 1 August 1995

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A texture effect in the silicon phase of industrial Fe-Si alloys was noticed in the X-ray diffraction patterns through the reinforcement of the 111 reflection. A similar effect was also apparent in a commercial silicon standard pellet used as reference material and supposed to be texture-free.

A quick correction procedure to account for preferred orientation effects was developed, based on a previous algorithm currently applied for the automatic profile fitting of powder diffractometer data. “Modified Wilson plots” are established for visualizing the efficiency of texture correction according to the proposed method.