Table of Contents
Textures and Microstructures
Volume 30, Issue 1-2, Pages 71-79

Thickness Determination of Surface Film for Textured Specimens by X-ray Diffraction

Public Laboratory of State Education Commission for High Temperature Materials and Testing, Shanghai Jiao Tong University, Shanghai 200030, China

Received 20 March 1997

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A simple and convenient X-ray diffraction method is proposed to determine the thickness of surface film for textured specimens. The analysis result for a synthetic specimen with surface film has proved that the method is applicable and reliable.