Table of Contents
Textures and Microstructures
Volume 30, Issue 3-4, Pages 133-143

The Effect of Soller Slit and Monochromator Used for Background Reduction in Texture Measurements

Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, de Croylaan 2, Heverlee 3001, Belgium

Received 6 September 1996

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


An X-ray texture goniometer equipped with a vertical Soller slit and a monochromator in the secondary beam in combination with Cu radiation is found to be useful for pole figure measurements on different materials, e.g. Al and Fe, as well as for low incident beam angle measurements on thin coatings. The obtained ODF's are less sensitive to errors in the procedure used for background correction of the pole figures than obtained with the classical setup used for pole figure measurements. The reason for that is the drastically ameliorated Intensity/Background (I/B) ratio by the use of the monochromator. Examples for cold rolled Fe and Al are presented. One of the merits of the new setup is that pole figures of Al, Cu, Ti, Fe can all be measured by using Cu Kα radiation, thus avoiding frequent and time-consuming exchanges of X-ray tubes.