Table of Contents
Textures and Microstructures
Volume 30 (1998), Issue 3-4, Pages 155-166

New Possibilities of Phase, Texture, and Stress Analysis Using Energy Dispersive Detectors

Rich. Seifert & Co Freiberger Präzisionsmechanik GmbH, Am St. Niclas Schacht 13, Freiberg D-09599, Germany

Received 14 November 1996

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


For angular dispersive and energy dispersive phase, texture, and stress analysis of compact samples (TiAl) and thin TiN layers, an electroluminescence detector and a Si(Li) semiconductor detector were applied. The parameters and application properties of the detectors are described. For angular dispersive measurements higher reflection intensities and better peak-to-background ratios can be attained, in comparison to conventional methods, by using multichannel pulse accumulation and mathematical spectrum evaluation.

In energy dispersive texture and stress measurements, reflection data from several lattice planes can be obtained simultaneously. In stress measurement, variations of lattice spacings in the order of 10-3 are reliably detectable. In principle, texture and stress information can be received from one measurement.