Table of Contents
Textures and Microstructures
Volume 35, Issue 1, Pages 39-54
http://dx.doi.org/10.1155/TSM.35.39

Quantification of Minor Texture Components by Hard X-Rays

1Materials Research Department, Riso Nat. Lab., Roskilde DK-4000, Denmark
2HASYLAB at DESY, Notkestrasse 85, Hamburg D-22607, Germany
3European Synchrotron Radiation Facility, BP 220, Grenoble F-38043 , France

Received 3 May 2001; Accepted 25 May 2001

Copyright © 2001 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Non-destructive methods to determine the volume fraction of minor texture components with very low reflection intensities are presented. The methods are based on polycrystalline diffraction of hard X-rays from synchrotron sources. By focusing the X-rays and scanning the specimen, it is shown that volume fractions as low as 10-9 can be registered, provided that the crystallographic orientations of such volume elements are far away from any major texture component. Simultaneously, the spatial resolving power is of the order 0.03 μm3. The relevance of such methods for nucleation studies and trace analysis is outlined.