539457.fig.002a
(a)
539457.fig.002b
(b)
539457.fig.002c
(c)
539457.fig.002d
(d)
Figure 2: AFM topographies of PEO-b-PS film after annealing for 8 h at 393 K with initial thickness of (a) 5.8 nm, (b) 10.7 nm, (c) 25.6 nm, (d) 43.9 nm.