Research Article
Growth and Etch Rate Study of Low Temperature Anodic Silicon Dioxide Thin Films
Table 2
Refractive index of the oxide films developed in potentiodynamic mode.
| Regime: potentiodynamic, pH = 4 | Current density (mA/cm2) | Water content (vol%) | Refractive index () |
| 5.5 | 0 | 1.4755 | 8 | 0 | 1.4756 | 5.5 | 0.2 | 1.4748 | 8 | 0.2 | 1.4749 | 5.5 | 0.7 | 1.4747 | 8 | 0.7 | 1.4752 |
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