Table of Contents Author Guidelines Submit a Manuscript
The Scientific World Journal
Volume 2014, Article ID 702906, 6 pages
Research Article

Research on Grading Detection of the Wheat Seeds

School of Information Science and Technology, Agricultural University of Hebei, Baoding 071002, China

Received 20 February 2014; Accepted 4 April 2014; Published 16 April 2014

Academic Editor: Luigi Cattivelli

Copyright © 2014 Xian-Zhong Han et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Evaluating the merits of the wheat seed is an important significance for wheat breeding. We studied analytic hierarchy process (AHP) for seeds grading by digital image processing techniques in the paper. Firstly, preprocess the collected wheat seed images; extract some parameters, such as area, plumpness, rectangular, and elongation of the seed, and then build the level model. Experiments showed the model is right, and level accuracy rate is more than 95%.