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The Scientific World Journal
Volume 2014, Article ID 982728, 7 pages
Research Article

A Test Data Compression Scheme Based on Irrational Numbers Stored Coding

1School of Computer and Information, Anqing Normal University, Anqing 246011, China
2Department of Science Research, Anqing Normal University, Anqing 246011, China

Received 27 June 2014; Revised 2 August 2014; Accepted 2 August 2014; Published 28 August 2014

Academic Editor: Yunqiang Yin

Copyright © 2014 Hai-feng Wu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.