Optical metrology provides full-field, noncontact, precise measurement of various physical parameters of materials, structures, and devices. These properties include kinematic parameters (displacement, velocity, and acceleration), deformation parameters (strains, curvature and twist), surface parameters (shape and roughness), and mechanical properties of materials (Young’s modulus, Poisson’s ratio, etc.). Researchers have developed many delicate optical measurement techniques and methods, such as photoelasticity, holographic interferometry, speckle metrology, Moiré methods, fiber sensing, laser Doppler vibrometry, and velocimetry and computer-vision-based techniques. However, new requirements arise with the recent development in fundamental research and industry applications to fulfill nondestructive and precise measurement under extreme conditions, such as high temperature or pressure, micro/nanoscale samples, large-scale curved structures, and transient events.

We invite investigators to contribute original research as well as review articles for describing effective optical measurement methods and instruments in these extreme environments and new strategies to realize high-precision measurements. We are particularly interested in articles on new methods and systems for measurement of materials and structures in the fields of aerospace, ocean, microelectronics and other industrial areas, advanced optical methods or spectroscopic techniques for mechanical property measurements of materials or devices at micro/nanoscales, new concepts on transient deformation or vibration measurements using high-speed video sensor systems and laser Doppler techniques, and innovative ideas for deformation and shape measurement on large-scale and/or curved structures. Potential topics include, but not limited to:

• Optical methods and instruments for deformation measurements under high-temperature/pressure conditions
• Mechanical property measurement with advanced optical methods at micro/nanoscale
• Latest optical imaging technology for deformations/profile measurement on large-scale curved structures
• Optical dynamic and transient techniques and instruments developed for structure deformation/vibration measurements
• Mechanical property measurement and analysis of various materials with optical spectrum or ray-detection technology, such as Raman spectroscopy, synchrotron radiation diagnosis, and X-ray imaging

Before submission authors should carefully read over the journal’s Author Guidelines, which are located at http://www.hindawi.com/journals/tswj/guidelines/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/submit/journals/tswj/optics/omet/ according to the following timetable: