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VLSI Design
Volume 1 (1993), Issue 1, Pages 45-60
http://dx.doi.org/10.1155/1993/38536

Analysis and Design of Regular Structures for Robust Dynamic Fault Testability

1Department of EECS, MIT Cambridge, Massachusetts, USA
2Synopsys, Mountain View, California, USA

Copyright © 1993 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Michael J. Bryan, Srinivas Devadas, and Kurt Keutzer, “Analysis and Design of Regular Structures for Robust Dynamic Fault Testability,” VLSI Design, vol. 1, no. 1, pp. 45-60, 1993. doi:10.1155/1993/38536