Table of Contents
VLSI Design
Volume 1, Issue 1, Pages 1-7
http://dx.doi.org/10.1155/1993/76586

Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays

Department of Electrical and Computer Engineering, University of Texas, Austin, Texas, USA

Copyright © 1993 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Earl E. Swartzlander Jr. and Miroslaw Malek, “Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays,” VLSI Design, vol. 1, no. 1, pp. 1-7, 1993. https://doi.org/10.1155/1993/76586.