Table of Contents
VLSI Design
Volume 1, Issue 4, Pages 345-357

Integrated Test Solutions for a System Design Environment

EECS Department, University of California, Berkeley, USA

Copyright © 1994 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Kevin T. Kornegay and Robert W. Brodersen, “Integrated Test Solutions for a System Design Environment,” VLSI Design, vol. 1, no. 4, pp. 345-357, 1994.