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VLSI Design
Volume 4 (1996), Issue 3, Pages 149-165

PGEN: A Novel Approach to Sequential Circuit Test Generation

1Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan
2Department of Computer Science, New Mexico Tech, Socorro, NM 87801, USA
3Department of Computer Science, Bloomsburg University, Bloomsburg, PA 17815, USA
4Department of Electrical Engineering, University of Ottawa, Ottawa ON K1N 6N5, Canada
5Information Technology Services, AT & T Universal Card Services, Jacksonville, FL 32220, USA

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Wen-Ben Jone, Nigam Shah, Anita Gleason, and Sunil R. Das, “PGEN: A Novel Approach to Sequential Circuit Test Generation,” VLSI Design, vol. 4, no. 3, pp. 149-165, 1996. doi:10.1155/1996/68463