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VLSI Design
Volume 4, Issue 3, Pages 181-197
http://dx.doi.org/10.1155/1996/72136

HYSIM: Hybrid Fault Simulation for Synchronous Sequential Circuits

Department of Electrical and Computer Engineering, University of Wisconsin—Madison, 1415 Johnson Drive, Madison, WI 53706-1691, USA

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Kyuchull Kim and Kewal K. Saluja, “HYSIM: Hybrid Fault Simulation for Synchronous Sequential Circuits,” VLSI Design, vol. 4, no. 3, pp. 181-197, 1996. https://doi.org/10.1155/1996/72136.