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VLSI Design
Volume 4, Issue 3, Pages 207-215
http://dx.doi.org/10.1155/1996/75798

On Generating Optimal Signal Probabilities for Random Tests: A Genetic Approach

1Motorola India Electronics Limited, 33A, VLSoor Road, Bangalore 560042, India
2Microprocessor Applications Laboratory, Indian Institute of Science, Bangalore 560 012, India

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

M. Srinivas and L. M. Patnaik, “On Generating Optimal Signal Probabilities for Random Tests: A Genetic Approach,” VLSI Design, vol. 4, no. 3, pp. 207-215, 1996. https://doi.org/10.1155/1996/75798.