Table of Contents
VLSI Design
Volume 5, Issue 3, Pages 285-298
http://dx.doi.org/10.1155/1997/54757

Operational and Test Performance in the Presence of Built-in Current Sensors

1Dept. of Electrical and Chemical Engineering, South Dakota School of Mines & Technology, 501, E. St. Joseph St., Rapid City, SD 57701, USA
2Dept. of Computer Science, Colorado State University, Fort Collins, CO 80523, USA
3Dept. of Electrical Engineering, Colorado State University, Fort Collins, CO 80523, USA
4SUNRISE Test Systems, Inc., 47211 Lakeview Blvd., Fremont, CA 94538-6530, USA

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, and Carol Q. Tong, “Operational and Test Performance in the Presence of Built-in Current Sensors,” VLSI Design, vol. 5, no. 3, pp. 285-298, 1997. https://doi.org/10.1155/1997/54757.