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VLSI Design
Volume 6, Issue 1-4, Pages 73-77
http://dx.doi.org/10.1155/1998/27462

A Study of Transconductance Degradation in HEMT Using a Self-consistent Boltzmann-Poisson-Schrödinger Solver

Department of Electrical and Computer Engineering, University of Nevada, Las Vegas 89154, NV, USA

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. Khoie, “A Study of Transconductance Degradation in HEMT Using a Self-consistent Boltzmann-Poisson-Schrödinger Solver,” VLSI Design, vol. 6, no. 1-4, pp. 73-77, 1998. https://doi.org/10.1155/1998/27462.