VLSI Design

VLSI Design / 1998 / Article

Open Access

Volume 6 |Article ID 46535 | 4 pages | https://doi.org/10.1155/1998/46535

Analysis of Q0-Independent Single-Electron Systems

Abstract

The random distribution of the background charges is a serious problem for integrated digital single-electron devices with capacitive coupling. We propose the new principle of operation of the devices which does not suffer from this problem.

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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