TY - JOUR AU - Kan, Edwin C. AU - Jin, Gyoyoung AU - Yu, Zhiping AU - Dutton, Robert W. PY - 1998 DA - 1900/01/01 TI - Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization SP - 076350 VL - 6 AB - SN - 1065-514X UR - https://doi.org/10.1155/1998/76350 DO - 10.1155/1998/76350 JF - VLSI Design PB - Hindawi Publishing Corporation KW - ER -