Table of Contents
VLSI Design
Volume 7, Issue 4, Pages 321-336

A High Level Synthesis System for VLSI Image Processing Applications

1ETCA Système de Perception Laboratory, 16 bis Avenue Prieur de la Côte d’Or, Arceuil, F-94114, France
2lnstitut d’Electronique Fondamentale, University of Paris-XI, Orsay, F-91405, France

Received 19 August 1994; Accepted 10 March 1995

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [2 citations]

The following is the list of published articles that have cited the current article.

  • F.S. Verdier, and B. Zavidovique, “High level synthesis of a defect detector,” Proceedings of Conference on Computer Architectures for Machine Perception, pp. 411–415, . View at Publisher · View at Google Scholar
  • Bertrand Zavidovique, and Vito Di Gesù, “The S-kernel: A measure of symmetry of objects,” Pattern Recognition, vol. 40, no. 3, pp. 839–852, 2007. View at Publisher · View at Google Scholar