Table of Contents
VLSI Design
Volume 11, Issue 1, Pages 23-34

Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-checking Circuits

1DEIS – University of Bologna, Viale Risorgimento 2, Bologna 40136, Italy
2University of Ferrara, Via Saragat 1, Ferrara 44100, Italy

Received 1 April 1999; Accepted 5 October 1999

Copyright © 2000 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


In this paper we propose signal coding and CMOS gates that are suitable to self-checking circuits with combinational functional blocks implemented also by next generation, very deep submicron technology. In particular, our functional blocks satisfy the Strongly Fault-Secure property with respect to a wide set of possible, internal faults including not only conventional stuck-ats, but also transistor stuck-ons, transistor stuck-opens, resistive bridgings, delays, crosstalks and transient faults, that are very likely to affect next generation ICs. Compared to alternative, existing solutions, that proposed here does not imply any critical constraint on the circuit electrical parameters. Therefore, it is suitable to be adopted to design very deep submicron self-checking circuits which, compared to todays' circuits, will present significantly increased sensitivity to parameter variations occurring during fabrication.