Abstract
Recently a multiple-sequence test generator was presented based on two-dimensional linear feedback shift registers (2-D LFSR). This generator can generate a set of precomputed test vectors obtained by an ATPG tool for detecting random-pattern-resistant faults and particular hard-to-detect faults. In addition, it can generate better random patterns than a conventional LFSR. In this paper we describe an optimized BIST scheme which has a configurable 2-D LFSR structure. Starting from a set of stuck-at faults and a corresponding set of test vectors detecting these faults, the corresponding test pattern generator is determined automatically. A synthesis procedure of designing this test generator is presented. Experimental results show that the hardware overhead is considerably reduced compared with 2-D LFSR generators.