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VLSI Design
Volume 11 (2000), Issue 1, Pages 35-45

Novel Single and Double Output TSC CMOS Checkers for m-out-of-n Codes

1Department of Computer Engineering and Informatics, University of Patras, Patras 26500, Greece
2Computer Technology Institute, Kolokotroni 3, Patra, Greece

Received 1 April 1999; Accepted 5 October 1999

Copyright © 2000 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper presents a novel method for designing Totally Self-Checking (TSC) m-out-of-n code checkers taking into account a realistic fault model including stuck-at, transistor stuck-on, transistor stuck-open, resistive bridging faults and breaks. The proposed design method is the first method in the open literature that takes into account a realistic fault model and can be applied for most practical values of m and n. Apart from the above the proposed checkers are very compact and very fast. The single output checkers are near optimal with respect to the number of transistors required for their implementation. Another benefit of the proposed TSC checkers is that all faults are tested by a very small set of single pattern tests, thus the probability of achieving the TSC goal is greater than in checkers requiring two-pattern tests. The single output TSC checkers proposed in this paper are the first known single output TSC checkers for m-out-of-n codes.