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VLSI Design
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2008
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Article
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Tab 1
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Research Article
Antirandom Testing: A Distance-Based Approach
Table 1
3-bit MHDTS.
Test
xyz
THD
TCD
𝑡
0
0 0 0
—
—
𝑡
1
1 1 1
3
1.7320
𝑡
2
0 1 0
3
2.4142
𝑡
3
1 0 1
6
4.146
𝑡
4
1 0 0
6
4.8284
𝑡
5
0 1 1
9
6.5604
𝑡
6
1 1 0
9
7.2426
𝑡
7
0 0 1
12
8.9746