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VLSI Design
Volume 2008, Article ID 283451, 7 pages
http://dx.doi.org/10.1155/2008/283451
Research Article

A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization

11INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, 4200-465 Porto, Portugal
2Department of Microelectronics, Faculty of EEMCS, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands
3Department of Electrical and Computer Engineering, University of British Columbia, 2332 Main Mall, Vancouver, BC, Canada V6T 1Z4

Received 17 October 2007; Accepted 26 February 2008

Academic Editor: Marcelo Lubaszewski

Copyright © 2008 L. A. Rocha et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

L. A. Rocha, L. Mol, E. Cretu, R. F. Wolffenbuttel, and J. Machado da Silva, “A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization,” VLSI Design, vol. 2008, Article ID 283451, 7 pages, 2008. https://doi.org/10.1155/2008/283451.