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VLSI Design
Volume 2008, Article ID 291686, 8 pages
http://dx.doi.org/10.1155/2008/291686
Research Article

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing

1School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA
2IBM Canada, Bromont, Quebec, Canada J2L 1A3
3TeraVicta Technologies, Austin, TX 78758, USA

Received 17 October 2007; Accepted 23 January 2008

Academic Editor: José Machado da Silva

Copyright © 2008 D. C. Keezer et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

D. C. Keezer, D. Minier, P. Ducharme, D. Viens, G. Flynn, and J. McKillop, “MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing,” VLSI Design, vol. 2008, Article ID 291686, 8 pages, 2008. https://doi.org/10.1155/2008/291686.