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VLSI Design
Volume 2008 (2008), Article ID 418165, 10 pages
Research Article

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA

Received 29 October 2007; Accepted 17 February 2008

Academic Editor: Bozena Kaminska

Copyright © 2008 Vishwanath Natarajan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Built-In RF test is a challenging problem due to the need to measure the values of complex test specifications on-chip with the precision of external RF test equipment. BIT techniques are necessary for guiding system adaptation during field operation. Prior research has demonstrated that embedded RF sensors can generate significant information about RF circuit performance. In this paper, we propose a test methodology that enables efficient BIT and BIT-enabled tuning of RF systems. A test generation approach is developed that co-optimizes the applied test stimulus, the type of embedded sensors, and the system response capture mechanisms for maximal accuracy of the BIT procedure. This BIT technique is also used to perform diagnostic testing of the transmitter. The information gathered from diagnosis is used to tune the transmitter for improved performance. Simulation results demonstrate that BIT-assisted diagnosis and tuning can be performed with good accuracy using the proposed methodology.