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VLSI Design
Volume 2008 (2008), Article ID 418165, 10 pages
Research Article

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA

Received 29 October 2007; Accepted 17 February 2008

Academic Editor: Bozena Kaminska

Copyright © 2008 Vishwanath Natarajan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [2 citations]

The following is the list of published articles that have cited the current article.

  • Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, and Fabio Cenni, “Adaptive logical control of RF LNA performances for efficient energy consumption,” Proceedings of the 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2010, pp. 161–166, 2010. View at Publisher · View at Google Scholar
  • Kwang-Ting Cheng, and Hsiu-Ming Chang, “Recent advances in analog, mixed-signal, and RF testing,” IPSJ Transactions on System LSI Design Methodology, vol. 3, pp. 19–46, 2010. View at Publisher · View at Google Scholar