Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="5"><hr/></td></tr><tr class="thead"><td align="left">Component</td><td align="center">Actual</td><td align="center">Envelope</td><td align="center">Peak</td><td align="center">RMS</td></tr><tr><td class="thead-hr" colspan="5"><hr/></td></tr><tr><td align="left">PA</td><td align="center">15.16</td><td align="center">14.14</td><td align="center">10.58</td><td align="center">10.64</td></tr><tr class="table-tr"><td colspan="5"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Performance degradation of the power amplifier at 15 dBm output power level.

VLSI Design

tab1

Table 1

Table 1: Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems 