Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

<table class="table-group" id="tab2"><tr><td><table class="table"><tr><td class="thead-hr" colspan="4"><hr/></td></tr><tr class="thead"><td align="left">Error type</td><td align="center">Envelope</td><td align="center">Peak</td><td align="center">RMS</td></tr><tr><td class="thead-hr" colspan="4"><hr/></td></tr><tr><td align="left">Rms_error</td><td align="center">0.1475</td><td align="center">0.2</td><td align="center">0.21</td></tr><tr class="table-tr"><td colspan="4"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Evaluation of the test quality for three types of DfT solution.

VLSI Design

tab2

Table 2

Table 2: Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems 