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VLSI Design
Volume 2008, Article ID 482159, 8 pages
http://dx.doi.org/10.1155/2008/482159
Research Article

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

1LIRMM, University of Montpellier/CNRS, 161 rue Ada, 34392 Montpellier, France
2NXP Semiconductors, 2 esplanade Anton Philips, Campus EffiScience, BP 20000, 14906 Caen Cedex 9, France

Received 30 September 2007; Revised 15 January 2008; Accepted 18 February 2008

Academic Editor: José Machado da Silva

Copyright © 2008 V. Kerzérho et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [3 citations]

The following is the list of published articles that have cited the current article.

  • Kerzérho, Azais, Comte, Cauvet, Bernard, and Renovell, “ANC-based method for testing converters with random-phase harmonics,” Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 2010. View at Publisher · View at Google Scholar
  • Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, and Michel Renovell, “Digital test method for embedded converters with unknown-phase harmonics,” Journal of Electronic Testing: Theory and Applications (JETTA), vol. 27, no. 3, pp. 335–350, 2011. View at Publisher · View at Google Scholar
  • Sachin Dileep Dasnurkar, and Jacob A. Abraham, “Arbitrary waveform generator response shaping method to enable ADC linearity testing on Very Low Cost automatic test equipment,” Proceedings - 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2011, pp. 67–71, 2011. View at Publisher · View at Google Scholar