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VLSI Design
Volume 2008, Article ID 482159, 8 pages
http://dx.doi.org/10.1155/2008/482159
Research Article

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

1LIRMM, University of Montpellier/CNRS, 161 rue Ada, 34392 Montpellier, France
2NXP Semiconductors, 2 esplanade Anton Philips, Campus EffiScience, BP 20000, 14906 Caen Cedex 9, France

Received 30 September 2007; Revised 15 January 2008; Accepted 18 February 2008

Academic Editor: José Machado da Silva

Copyright © 2008 V. Kerzérho et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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