ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

<table class="table-group" id="tab3"><tr><td><table class="table"><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr class="thead"><td align="left"></td><td align="center">THD (dB)</td><td align="center">SFDR (dB)</td></tr><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr><td align="left">Standard test with AWG2021</td><td align="center">−51.6</td><td align="center">52.5</td></tr><tr><td align="left">Reference test</td><td align="center">−68.4</td><td align="center">63.5</td></tr><tr class="table-tr"><td colspan="3"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Test results for the standard test using low-resolution AWG versus reference test setup.

VLSI Design

tab3

Table 3

Table 3: ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator 