| | Structural specifications | Evaluation at structural level | Evaluation at functional level | Evaluation at behavioral level | | Structural parameter | Typical value | Limit value | Faulty circuits (PPM) | Detection limit of structural parameter SPd | Undetected faulty circuits with SPd (PPM) | Detection limit of translated functional parameter | Undetected faulty circuits with (PPM) | Error of undetected faulty circuits (%) | Detection limit of translated behavioral parameter | Undetected faulty circuits with SPdt (PPM) | Error of undetected faulty circuits (%) |
| | Resistance () | Max | 2,500E+00 | 3,250E+00 | 7,944E−01 | 3,254E+00 | 8,791E−02 | | 7,944E−01 | 88,93 | 3,253E+00 | 7,111E−02 | 2,12 |
| | Capacitor (F) | Max | 1,000E−12 | 1,100E−12 | 7,944E−01 | 1,100E−12 | 8,785E−02 | | 7,944E−01 | 88,94 | 1,100E−12 | 7,099E−02 | 2,12 | | Max | 1,400E−12 | 1,540E−12 | 7,944E−01 | 1,541E−12 | 8,794E−02 | 1,543E−12 | 3,220E−01 | 29,46 | 1,541E−12 | 7,111E−02 | 2,12 | | Max | 1,000E−11 | 1,100E−11 | 7,944E−01 | 1,100E−11 | 8,802E−02 | 1,106E−11 | 6,324E−01 | 68,53 | 1,100E−11 | 7,116E−02 | 2,12 |
| | Inductor (H) | Min | 1,000E−06 | 9,500E−07 | 7,944E−01 | 9,498E−07 | 8,788E−02 | 1,149E−07 | 7,944E−01 | 88,94 | 9,498E−07 | 7,113E−02 | 2,11 | | Max | 1,000E−06 | 1,050E−06 | 7,944E−01 | 1,050E−06 | 8,819E−02 | | 7,944E−01 | 88,90 | 1,050E−06 | 7,099E−02 | 2,16 |
| | Transistor | LM_X2 Min | 2,400E−07 | 2,360E−07 | 7,944E−01 | 2,360E−07 | 8,819E−02 | | 7,944E−01 | 88,90 | 2,360E−07 | 7,143E−02 | 2,11 | | LM_X2 Max | 2,400E−07 | 2,567E−07 | 7,944E−01 | 2,568E−07 | 8,790E−02 | 3,663E−07 | 7,944E−01 | 88,93 | 2,567E−07 | 7,119E−02 | 2,10 | | WF_X2 Min | 1,000E−05 | 9,900E−06 | 7,944E−01 | 9,900E−06 | 8,802E−02 | | 7,944E−01 | 88,92 | 9,900E−06 | 7,116E−02 | 2,12 | | WF_X2 Max | 1,000E−05 | 1,200E−05 | 7,944E−01 | 1,201E−05 | 8,793E−02 | 1,660E−05 | 7,944E−01 | 88,93 | 1,201E−05 | 7,108E−02 | 2,12 |
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