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VLSI Design
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Special Issues
VLSI Design
/
2008
/
Article
/
Alg 1
/
Research Article
A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
Algorithm 1
C
-language routine implementing the presented scheme.
int TEC(int
𝑁
,
int
𝐵
,
int
𝑉
)
return
;
(
𝑉
%
𝐵
)
∗
(
𝑁
d
i
v
𝐵
)
+
(
𝑉
d
i
v
𝐵
)