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VLSI Design
Volume 2008, Article ID 680157, 8 pages
http://dx.doi.org/10.1155/2008/680157
Research Article

A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Department of Informatics, Technological Educational Institute of Athens, Athens 12210, Greece

Received 27 March 2007; Accepted 5 December 2007

Academic Editor: Bashir M. Al-Hashimi

Copyright © 2008 Ioannis Voyiatzis. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [6 citations]

The following is the list of published articles that have cited the current article.

  • I. Voyiatzis, C. Efstathiou, and C. Sgouropoulou, “Embedding test vectors in accumulator - based TPG using progressive search,” 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), pp. 169–170, . View at Publisher · View at Google Scholar
  • Dimitrios Magos, Ioannis Voyiatzis, and Steffen Tarnick, “A Low-Cost Accumulator-Based Test Pattern Generation Architecture,” 2008 14th IEEE International On-Line Testing Symposium, pp. 267–272, . View at Publisher · View at Google Scholar
  • Nestor Ioannidis, and Ioannis Voyiatzis, “Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time,” pp. 55–59, . View at Publisher · View at Google Scholar
  • D. Kavvadias, S. Sinitos, I. Voyiatzis, H. Antonopoulou, and C. Efstathiou, “On Embedding Test Sets into Hardware Generated Sequences,” 2010 14th Panhellenic Conference on Informatics, . View at Publisher · View at Google Scholar
  • Dimitrios Magos, Ioannis Voyiatzis, and Steffen Tarnick, “An accumulatorbased test-per-clock scheme,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 19, no. 6, pp. 1090–1094, 2011. View at Publisher · View at Google Scholar
  • I. Voyiatzis, C. Efstathiou, and C. Sgouropoulou, “Test vector embedding in accumulators with stored carry in O(1) time,” 7th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2012, 2012. View at Publisher · View at Google Scholar